IEEE Transactions on Device and Materials Reliability

Title Titel

e-ISSN

1558-2574

ISSN

1530-4388

Publisher Herausgeber

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publisher's Address Herausgeber Adresse

445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141

Listed in SCI Aufgelistet im SCI

Peer reviewed Begutachtet

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Subject: exponential step height distribution

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		Preview	Author(s)	Title	Type	Issue Date
	1		Tselios, Konstantinos ; Knobloch, Theresia ; Waldhör, Dominic ; Stampfer, Bernhard ; Ioannidis , Eleftherios ; Enichlmair , Hubert ; Minixhofer , Rainer ; Grasser, Tibor ; Waltl, Michael	Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂ Transistors	Article Artikel	Sep-2023