IEEE Transactions on Electron Devices

Title Titel

e-ISSN

1557-9646

ISSN

0018-9383

Publisher Herausgeber

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publisher's Address Herausgeber Adresse

445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141

Listed in SCI Aufgelistet im SCI

Peer reviewed Begutachtet

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Author: Grasser, Tibor

Subject: mixed-mode stress

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		Preview	Author(s)	Title	Type	Issue Date
	1		Jech, Markus ; Rott, Gunnar ; Reisinger, Hans ; Tyaginov, Stanislav ; Rzepa, Gerhard ; Grill, Alexander ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor	Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and Peculiarities	Artikel Article	Aug-2020