IEEE Transactions on Instrumentation and Measurement

Title Titel
IEEE Transactions on Instrumentation and Measurement
 
e-ISSN
1557-9662
 
ISSN
0018-9456
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Results 1-20 of 23 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Poik, Mathias ; Kohl, Dominik ; Mayr, Mario ; Kerschner, Christoph ; Schitter, Georg A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical OscillationsArtikel Article 2020
2Fuerst, Martin E. ; Csencsics, Ernst ; Berlakovich, Nikolaus ; Schitter, Georg Automated Measurement of Highly Divergent Optical Wavefronts with a Scanning Shack-Hartmann SensorArtikel Article 2020
3Wegleiter, Hannes ; Schweighofer, Bernhard ; Deinhammer, Christian ; Holler, Gert ; Fulmek, Paul Automatic Antenna Tuning Unit to Improve RFID System PerformanceArtikel Article 2011
4Fabini, Joachim ; Abmayer, Michael Delay Measurement Methodology Revisited: Time-slotted Randomness CancellationArtikel Article 2013
5Caban, Sebastian ; Lerch, Martin ; Pratschner, Stefan ; Zöchmann, Erich ; Svoboda, Philipp ; Rupp, Markus Design of Experiments to Compare Base Station Antenna ConfigurationsArtikel Article Oct-2019
6Laimer-2025-IEEE Transactions on Instrumentation and Measurement-vor.pdf.jpgLaimer, Matthias ; Kern, Thomas ; Brukner, Lara ; Schitter, Georg ; Csencsics, Ernst Enabling precise 2-D in-plane displacement sensing with low latency for motion tracking applicationsArticle Artikel 29-Sep-2025
7Naverschnigg, Christopher ; Csencsics, Ernst ; Schitter, Georg Flexible Robot-Based In-Line Measurement System for High-Precision Optical Surface InspectionArticle Artikel 25-Oct-2022
8Lewis, Soren ; Russold, Michael Friedrich ; Dietl, Hans ; Ruff, Roman ; Audi, Josep Marcel Cardona ; Hoffmann, Klaus-Peter ; Abu-Saleh, Lait ; Schroder, Dietmar ; Krautschneider, Wolfgang ; Westendorff, Stephanie ; Gail, Alexander ; Meiners, Thomas ; Kaniusas, Eugenijus Fully implantable multi-channel measurement system for acquisition of muscle activityArtikel Article 2013
9Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in LiquidsArticle Artikel 19-Dec-2022
10Kern, Thomas ; Laimer, Matthias ; Schitter, Georg ; Csencsics, Ernst Laser triangulation measurements on moving samples with reduced lateral feature uncertaintyArticle Artikel 14-Oct-2024
11Thier, Markus ; Paris, Rene ; Thurner, Thomas ; Schitter, Georg Low-Latency Shack Hartmann Wavefront Sensor Based on an Industrial Smart CameraArtikel Article 2013
12Thürk, Florian ; Kampusch, Stefan ; Kaniusas, Eugenijus Management Framework for Biosignals in Biomedical Studies: From Study Design to Data StatisticsArtikel Article 2016
13Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Model-Based RF Sensing for Contactless High-Resolution Voltage MeasurementsArticle Artikel 20-Sep-2023
14Kaniusas, Eugenijus ; Varoneckas, Giedrius ; Mahr, Benedikt ; Szeles, Jozsef Constantin Optic Visualization of Auricular Nerves and Blood Vessels: Optimisation and ValidationArtikel Article 2011
15Schlarp, Johannes ; Csencsics, Ernst ; Schitter, Georg Optical scanning of a laser triangulation sensor for 3D imagingArtikel Article 2020
16Paris, Rene ; Melik-Merkumians, Martin ; Schitter, Georg Probabilistic Absolute Position Sensor Based on Objective Laser SpecklesArtikel Article May-2016
17Wertjanz, Daniel ; Berlakovich, Nikolaus ; Csencsics, Ernst ; Schitter, Georg Range extension for large-scale robotic precision 3-D measurements in vibration-prone environmentsArticle Artikel 2023
18Haider, Christian ; Fuerst, Martin E. ; Laimer, Matthias ; Csencsics, Ernst ; Schitter, Georg Range-extended confocal chromatic sensor system for double-sided measurement of optical components with high lateral resolutionArticle Artikel 25-Oct-2022
19Csencsics, Ernst Karl ; Schlarp, Johannes ; Glaser, Tobias ; Wolf, Tobias ; Schitter, Georg Reducing the Speckle-induced Measurement Uncertainty in Laser Triangulation SensorsArticle Artikel 2023
20Litzenberger, Martin ; Fürböck, Christoph ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free-Carrier Mapping in Semiconductor DevicesArtikel Article 2005