Microelectronics Reliability
Title Titel
Microelectronics Reliability
e-ISSN
1872-941X
ISSN
0026-2714
Publisher Herausgeber
PERGAMON-ELSEVIER SCIENCE LTD
Listed in SCI Aufgelistet im SCI
Peer reviewed Begutachtet
Access Type
Subject
- 2 Atomic and Molecular Physics, and Optics
- 2 Condensed Matter Physics
- 2 Electrical and Electronic Engineering
- 2 Electronic, Optical and Magnetic Materials
- 2 Safety, Risk, Reliability and Quality
- 2 Surfaces, Coatings and Films
- 1 bias temperature Instabilties
- 1 circuit reliability
- 1 circuit simulation
- 1 device reliability
- next >
Results 1-3 of 3 (Search time: 0.002 seconds).