Microelectronics Reliability
Title Titel
Microelectronics Reliability
e-ISSN
1872-941X
ISSN
0026-2714
Publisher Herausgeber
PERGAMON-ELSEVIER SCIENCE LTD
Listed in SCI Aufgelistet im SCI
Peer reviewed Begutachtet
Access Type
Subject
- 5 Atomic and Molecular Physics, and Optics
- 5 Condensed Matter Physics
- 5 Electrical and Electronic Engineering
- 5 Electronic, Optical and Magnetic Materials
- 5 Safety, Risk, Reliability and Quality
- 5 Surfaces, Coatings and Films
- 1 Ab initio studies in amorphous SiO2 Nonradiative multi-phonon defect model Oxygen vacancy Hydrogen bridge Hydroxyl-E′
- 1 bias temperature Instabilties
- 1 center Electron/hole traps Metastability of defects Statistics of defect properties MOSFET Si/SiC substrates Bias temperature insta
- 1 circuit reliability
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Date issued
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