Microelectronics Reliability

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Journal description

Title Titel
Microelectronics Reliability
 
e-ISSN
1872-941X
 
ISSN
0026-2714
 
Publisher Herausgeber
PERGAMON-ELSEVIER SCIENCE LTD
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 
 

Publications Publikationen

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Subject:  Surfaces, Coatings and Films
Date Issued:  [2000 TO 2009]

Results 1-9 of 9 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Holzer, Stefan ; Sheikholeslami, Alireza ; Karner, Markus ; Grasser, Tibor ; Selberherr, Siegfried Comparison of Deposition Models for a TEOS LPCVD ProcessArtikel Article2007
2Grasser, Tibor ; Selberherr, Siegfried EditorialArtikel ArticleJun-2007
3Heer, M. ; Grombach, P. ; Heid, A. ; Pogany, D. Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applicationsArtikel Article2008
4Tyaginov, Stanislav ; Sverdlov, Viktor ; Starkov, Ivan ; Gös, Wolfgang ; Grasser, Tibor Impact of O-Si-O Bond Angle Fluctuations on the Si-O Bond-Breakage RateArtikel Article2009
5Sverdlov, V. ; Kosina, H. ; Selberherr, S. Modeling Current Transport in Ultra-Scaled Field-Effect TransistorsArtikel Article2006
6Hehenberger, Ph. ; Wagner, P.-J. ; Reisinger, H. ; Grasser, T. On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature StressArtikel Article2009
7Aichinger, T. ; Nelhiebel, M. ; Grasser, T. On the Temperature Dependence of NBTI RecoveryArtikel Article2008
8Smetana, Walter ; Balluch, Bruno ; Stangl, Günther ; Lüftl, Sigrid ; Seidler, Sabine Processing procedures for the realization of fine structured channel arrays and bridging elements by LTCC-TechnologyArtikel Article2009
9Karner, M. ; Gehring, A. ; Wagner, M. ; Entner, R. ; Holzer, S. ; Goes, W. ; Vasicek, M. ; Grasser, T. ; Kosina, H. ; Selberherr, S. VSP - A Gate Stack AnalyzerArtikel Article 2007