Record link: 
http://hdl.handle.net/20.500.12708/168457
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Title: 
Editorial
en
Citation: 
Grasser, T., & Selberherr, S. (2007). Editorial. Microelectronics Reliability, 47(6), 839–840. https://doi.org/10.1016/j.microrel.2006.10.005
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Publisher DOI: 
10.1016/j.microrel.2006.10.005
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Publication Type: 
Article - Editorial
en
Language: 
English
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Authors: 
Grasser, Tibor 
Selberherr, Siegfried 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Journal: 
Microelectronics Reliability 
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ISSN: 
0026-2714
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Date (published): 
Jun-2007
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Number of Pages: 
2
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Publisher: 
PERGAMON-ELSEVIER SCIENCE LTD
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Peer reviewed: 
No
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Keywords: 
Electrical and Electronic Engineering; Condensed Matter Physics; Electronic, Optical and Magnetic Materials; Atomic and Molecular Physics, and Optics; Safety, Risk, Reliability and Quality; Surfaces, Coatings and Films
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Science Branch: 
Elektrotechnik, Elektronik
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