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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Kaczer, B. ; Franco, J. ; Weckx, P. ; Roussel, Ph.J. ; Putcha, V. ; Bury, E. ; Simicic, M. ; Chasin, A. ; Linten, D. ; Parvais, B. ; Catthoor, F. ; Rzepa, G. ; Waltl, M. ; Grasser, T. | A Brief Overview of Gate Oxide Defect Properties and Their Relation to MOSFET Instabilities and Device and Circuit Time-Dependent Variability | Artikel Article  | 2018 |
| 2 | | de Orio, R.L. ; Ceric, H. ; Selberherr, S. | A Compact Model for Early Electromigration Failures of Copper Dual-Damascene Interconnects | Artikel Article | 2011 |
| 3 | | Rafiee, P. ; Khatibi, G. | A fast reliability assessment method for Si MEMS based microcantilever beams | Artikel Article | 2014 |
| 4 | | Seliger, N. ; Pogany, D. ; Fürböck, C. ; Habaš, P. ; Gornik, E. ; Stoisiek, M. | A Laser Beam Method for Evaluation of Thermal Time Constant in Smart Power Devices | Artikel Article | 1997 |
| 5 | | Filipovic, Lado | A Method for Simulating the Influence of Grain Boundaries and Material Interfaces on Electromigration | Artikel Article | 2019 |
| 6 | | Khan, Sajid ; Shah, Ambika Prasad ; Chouhan, Shailesh Singh ; Gupta, Neha ; Pandey, Jai Gopal ; Vishvakarma, Santosh Kumar | A Symmetric D Flip-Flop Based PUF with Improved Uniqueness | Artikel Article | 2020 |
| 7 | | Wilhelmer, Christoph ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor | Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture | Artikel Article | 2022 |
| 8 | | Dubek, Krisztián ; Schneidhofer, Christoph ; Dörr, Nicole ; Rojacz, Harald ; Plank, Bernhard ; Schmid, Ulrich | Accelerated lifetime estimation and failure analysis of micromachined humidity sensors under high temperature and high humidity conditions | Article Artikel | Nov-2025 |
| 9 | | Tyaginov, S. ; Starkov, I. ; Enichlmair, H. ; Jungemann, Ch. ; Park, J.M. ; Seebacher, E. ; Orio, R. ; Ceric, H. ; Grasser, T. | An Analytical Approach for Physical Modeling of Hot-Carrier Induced Degradation | Artikel Article | 2011 |
| 10 | | Ceric, H. ; Zahedmanesh, H. ; Croes, K. | Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods | Artikel Article | 2019 |
| 11 | | Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J | Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up | Artikel Article | 2006 |
| 12 | | Wieland, D. ; Butej, B. ; Stabentheiner, M. ; Koller, C. ; Pogany, D. ; Ostermaier, C. | Analyzing the role of hole injection on the short circuit performance of p-GaN gate power HEMTs | Article Artikel | Jun-2025 |
| 13 | | Pogany, D. ; Bychikhin, S. ; Heer, M. ; Mamanee, W. ; Gornik, E. | Application of transient interferometric mapping method for ESD and latch-up analysis | Artikel Article | 2011 |
| 14 | | Magnien, J. ; Khatibi, G. | Assessment of mechanical reliability of surface mounted capacitor by an accelerated shear fatigue test technique | Artikel Article | 2014 |
| 15 | | Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard | Automated setup for thermal imaging and electrical degradation study of power DMOS devices | Artikel Article | 2005 |
| 16 | | Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang | Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal Shorts | Artikel Article | 2007 |
| 17 | | Franco, J. ; Graziano, S. ; Kaczer, B. ; Crupi, F. ; Ragnarsson, L.-Å. ; Grasser, T. ; Groeseneken, G. | BTI Reliability of Ultra-Thin EOT MOSFETs for Sub-Threshold Logic | Artikel Article | 2012 |
| 18 | | Walter, Thomas ; Khatibi, Golta ; Nelhiebel, Michael ; Steffeneli, Mario | Characterization of cyclic delamination behavior of thin film multilayers | Artikel Article | 1-Oct-2018 |
| 19 | | Camargo, V. V. A. ; Kaczer, Ben ; Grasser, Tibor ; Wirth, G. | Circuit Simulation of Workload-Dependent RTN and BTI Based on Trap Kinetics | Artikel Article | 2014 |
| 20 | | Sharma, P. ; Tyaginov, S. ; Wimmer, Y. ; Rudolf, F. ; Rupp, K. ; Enichlmair, H. ; Park, J.-M. ; Ceric, H. ; Grasser, T. | Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs | Artikel Article | 2015 |
