Surface and Interface Analysis

Title Titel
Surface and Interface Analysis
 
e-ISSN
1096-9918
 
ISSN
0142-2421
 
Publisher Herausgeber
WILEY
 
Publisher's Address Herausgeber Adresse
111 RIVER ST, HOBOKEN, USA, NJ, 07030-5774
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Results 1-20 of 28 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Zemek, J. ; Jiricek, P. ; Werner, Wolfgang S.M. ; Lesiak, B. ; Jablonski, A. Angular-resolved elastic peak electron spectroscopy: experiment and Monte Carlo calculationsArtikel Article2006
2Kiniger, M. ; Eisenmenger-Sittner, C. ; Hell, J. ; Schwarz, B. ; Hutter, H. ; Puchner, S. Carbide formation upon heat treatment of molybdenum layers deposited on carbon substrates: comparison of experimental data with a cellular automaton modelArtikel Article2008
3Müller, Anja ; Krahl, Thoralf ; Radnik, Jörg ; Wagner, Andreas ; Kreyenschulte, Carsten ; Werner, Wolfgang S.M. ; Ritter, Benjamin ; Kemnitz, Erhard ; Unger, Wolfgang E.S. Chemical in-depth analysis of (Ca/Sr)F₂ core-shell like nanoparticles by X-ray photoelectron spectroscopy with tunable excitation energyArtikel Article 2021
4Müller, Anja ; Krahl, Thoralf ; Radnik, Jörg ; Wagner, Andreas ; Kreyenschulte, Carsten ; Werner, Wolfgang S.M. ; Ritter, Benjamin ; Kemnitz, Erhard ; Unger, Wolfgang E.S. Chemical in‐depth analysis of (Ca/Sr)F2 core–shell like nanoparticles by X‐ray photoelectron spectroscopy with tunable excitation energyArticle Artikel 2021
5Katona, L. ; Bianchi, D. ; Brenner, J. ; Vorlaufer, G. ; Vernes, András Effect of surface roughness on angle-resolved XPSArtikel Article 2012
6Powell, C. J. ; Werner, W. S. M. ; Smekal, W. ; Tasneem, G. Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on siliconArtikel Article2013
7Powell, C. J. ; Werner, W. S. M. ; Smekal, W. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2011
8Werner, Wolfgang ; Helmberger, Fabian ; Schürrer, Manuel ; Ridzel, Olga ; Stöger‐Pollach, Michael ; Eisenmenger-Sittner, Christoph Electron inelastic mean free path (IMFP) values of Kapton, polyethylene (PE), polymethylmethacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE) measured with elastic peak electron spectroscopy (EPES)Article Artikel Aug-2022
9Meirer, F. ; Streli, C. ; Pepponi, G. ; Wobrauschek, P. ; Zaitz, M. A. ; Horntrich, C. ; Falkenberg, G. Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surfaceArtikel Article 2008
10Sobol, Oded ; Holzlechner, Gerald ; Holzweber, Markus ; Lohninger, Johann ; Boellinghaus, Thomas ; Unger, W. First use of data fusion and multivariate analysis of ToF-SIMS and SEM image data for studying deuterium-assisted degradation processes in duplex steelsArtikel Article 2016
11Bonanni, A. ; Stifter, D. ; Hingerl, K. ; Störi, Herbert ; Werner, Wolfgang S.M. ; Brenner, Josef ; Weithaler, C. ; Gruska, B. ; Prunel, G. ; Delaire, V. ; Sanvito, T. In situ spectroscopic ellipsometry as a sensor for hard coatings and steel nitridingArtikel Article2002
12Gervasoni, Juana L. ; Barrachina, R.O. ; Segui, S. ; Werner, Wolfgang S.M. In-out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surfaceArtikel Article2013
13Tasneem, Ghazala ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2014
14Köver, Laszlo ; Novak, M.A. ; Egri, S. ; Cserny, I. ; Berényi, Z. ; Tóth, J. ; Varga, D. ; Drube, W. ; Yubero, F. ; Tougaard, Sven ; Werner, Wolfgang S.M. Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid GeArtikel Article2006
15Werner, Wolfgang S.M. ; Zemek, J. ; Jiricek, P. Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu₂OArtikel Article2006
16Werner, Wolfgang S.M. ; Helmberger, Fabian ; Schürrer, Manuel ; Eisenmenger-Sittner, Christoph ; Ridzel, Olga Y. Measurement of the surface excitation parameter of Kapton, polyethylene (PE), polymethyl methacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE)Artikel Article Jul-2022
17Lilienkamp, G. ; Suchorski, Yuri Metastabile impact electron emission microscopy: principles and applicationsArtikel Article2006
18Bianchi, D. ; Katona, L. ; Brenner, J. ; Vorlaufer, Georg ; Vernes, András ; Werner, Wolfgang S.M. Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowingArtikel Article 2015
19Yuryevna Ridzel, Olga ; Kalbe, Henryk ; Astašauskas, Vytautas ; Kuksa, Pavel ; Bellissimo, Alessandra ; Werner, Wolfgang S. M. Optical constants of organic insulators in the UV range extracted from reflection electron energy loss spectraArtikel Article 2022
20Tasneem, Ghazala ; Tomastik, Christian ; Gerhold, Stefan ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulationsArtikel Article2010