Thin Solid Films

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Journal description

Title Titel
Thin Solid Films
 
e-ISSN
1879-2731
 
ISSN
0040-6090
 
Publisher Herausgeber
ELSEVIER SCIENCE SA
 
Publisher's Address Herausgeber Adresse
PO BOX 564, LAUSANNE, SWITZERLAND, 1001
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2024]
Date Issued:  [2010 TO 2019]
Date Issued:  2013

Results 1-6 of 6 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Bartosik, M. ; Daniel, R. ; Mitterer, C. ; Matko, I. ; Burghammer, M. ; Mayrhofer, P.H. ; Keckes, J. Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNₓ thin filmArtikel Article2013
2Novalin, Sabrina ; Rennhofer, Marcus ; Summhammer, Johann Electrical metastabilities in chalcogenide photovoltaic devicesArtikel Article2013
3Schlögl, M. ; Paulitsch, J. ; Keckes, J. ; Mayrhofer, P.H. Influence of AlN Layers on Mechanical Properties and Thermal Stability of Cr-Based Nitride CoatingsArtikel Article2013
4Schlögl, M. ; Mayer, B. ; Paulitsch, J. ; Mayrhofer, P.H. Influence of CrN and AlN layer thicknesses on structure and mechanical properties of CrN/AlN superlatticesArtikel Article2013
5Illarionov, Yu.Yu. ; Vexler, M.I. ; Fedorov, V.V. ; Suturin, S.M. ; Sokolov, N.S. Light Emission from the Au/CaF2/p-Si(111) Capacitors: Evidence for an Elastic Electron Tunneling Through a Thin (1-2 nm) Fluoride LayerArtikel Article2013
6Rumpf, K. ; Granitzer, P. ; Poelt, P. ; Reissner, M. Specific loading of porous silicon with iron oxide nanoparticles to achieve different blocking temperaturesArtikel Article2013