Title Titel
Thin Solid Films
 
e-ISSN
1879-2731
 
ISSN
0040-6090
 
Publisher Herausgeber
ELSEVIER SCIENCE SA
 
Publisher's Address Herausgeber Adresse
PO BOX 564, LAUSANNE, SWITZERLAND, 1001
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Surfaces, Coatings and Films
Date Issued:  [2010 TO 2019]
Date Issued:  2016

Results 1-5 of 5 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Frischmuth, Tobias ; Schneider, Michael ; Maurer, Daniel ; Grille, Thomas ; Schmid, Ulrich High temperature annealing effects on the chemical and mechanical properties of inductively-coupled plasma-enhanced chemical vapor deposited a-SiC:H thin filmsArtikel Article 2016
2Riedl, H. ; Koller, C.M. ; Munnik, F. ; Hutter, H. ; Mendez Martin, F. ; Rachbauer, R. ; Kolozsvári, S. ; Bartosik, M. ; Mayrhofer, P.H. Influence of oxygen impurities on growth morphology, structure and mechanical properties of Ti-Al-N thin filmsArtikel Article 2016
3Frischmuth, Tobias ; Schneider, Michael ; Bogdanović Radović, Iva ; Siketić, Zdravko ; Maurer, Daniel ; Grille, Thomas ; Schmid, Ulrich Lowtemperature deposition of a-SiC:H thin films applying a dual plasma source processArtikel Article 2016
4Dergez, D. ; Schneider, M. ; Bittner, A. ; Pawlak, N. ; Schmid, U. Mechanical and electrical properties of RF magnetron sputter deposited amorphous silicon-rich silicon nitride thin filmsArtikel Article 2016
5Arndt, Björn ; Noei, Heshmat ; Keller, Thomas F. ; Müller, Patrick ; Vonk, Vedran ; Nenning, Andreas ; Opitz, Alexander K. ; Fleig, Jürgen ; Rütt, Uta ; Stierle, Andreas Structure and Stability of Gd-doped CeO₂ thin films on yttria-stabilized zirconiaArtikel Article 2016