Thin Solid Films

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Journal description

Title Titel
Thin Solid Films
 
e-ISSN
1879-2731
 
ISSN
0040-6090
 
Publisher Herausgeber
ELSEVIER SCIENCE SA
 
Publisher's Address Herausgeber Adresse
PO BOX 564, LAUSANNE, SWITZERLAND, 1001
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Surfaces, Coatings and Films
Date Issued:  [2000 TO 2009]

Results 1-8 of 8 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schmid, U. ; Seidel, H. Effect of High Temperature Annealing on the Electrical Performance of Titanium/Platinum Thin FilmsArtikel Article2008
2Schmid, U. ; Seidel, H. Effect of Substrate Properties and Thermal Annealing on the Resistivity of Molybdenum Thin FilmsArtikel Article2005
3Gall, S. ; Schneider, J. ; Klein, J. ; Hübener, K. ; Muske, M. ; Rau, B. ; Conrad, E. ; Sieber, I. ; Petter, K. ; Lips, K. ; Stöger-Pollach, M. ; Schattschneider, P. ; Fuhs, W. Large-grained polycrystalline silicon on glass for thin-film solar cellsArtikel Article2006
4Bethge, Ole ; Abermann, Stephan ; Henkel, Christoph ; Bertagnolli, Emmerich Low temperature atomic layer deposition of high-k dielectric stacks for scaled metal-oxide-semiconductor devicesArtikel Article2009
5Koch, T. ; Evaristo, M. ; Pauschitz, A. ; Roy, Manish ; Cavaleiro, A. Nanoindentation and nanoscratch behaviour of reactive sputtered deposited W-S-C filmArtikel Article2009
6Mathur, Sanjay ; Sivakov, Vladimir ; Shen, H. ; Barth, Sven Christian ; Cavelius, Christian ; Nilsson, Andreas ; Kuhn, Patrick Nanostructured films of iron, tin and titanium oxides by chemical vapour depositionArtikel Article 28-Apr-2006
7Stöger-Pollach, M. ; Walter, T. ; Muske, M. ; Gall, S. ; Schattschneider, P. Phase transformations of an alumina membrane and its influence on silicon nucleation during the aluminium induced layer exchangeArtikel Article2007
8Grosser, M. ; Schmid, U. The impact of sputter conditions on the microstructure and on the resistivity of tantalum thin filmsArtikel Article 2009