Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Stöger-Pollach, M.
Date Issued:  [2010 TO 2019]

Results 1-14 of 14 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stöger-Pollach, Michael A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMArtikel Article2014
2Wallisch, Wolfgang ; Stöger-Pollach, Michael ; Navickas, Edvinas Consequences of the CMR effect on EELS in TEMArtikel Article 2017
3Schachinger, T. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Stöger-Pollach, M. ; Schneider, S. ; Pohl, D. ; Rellinghaus, B. ; Schattschneider, P. EMCD with an electron vortex filter: Limitations and possibilitiesArtikel Article 2017
4Kaiser, Ute ; Stöger-Pollach, Michael Foreword to the special issue low-voltage electron microscopyArtikel ArticleOct-2014
5Stöger-Pollach, Michael ; Bukvišová, Kristýna ; Schwarz, Sabine ; Kvapil, Michal ; Šamořil, Tomáš ; Horák, Michal Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductorsArtikel Article 2019
6Schattschneider, P. ; Löffler, S. ; Stöger-Pollach, M. ; Verbeeck, J. Is magnetic chiral dichroism feasible with electron vortices?Artikel Article 2014
7Stöger-Pollach, M. Low voltage EELS-How low?Artikel Article2014
8Schachinger, T. ; Löffler, S. ; Stöger-Pollach, M. ; Schattschneider, P. Peculiar rotation of electron vortex beamsArtikel Article 2015
9Schattschneider, Peter ; Ennen, Inga ; Stöger-Pollach, Michael ; Verbeeck, Johan ; Mauchamp, Vincent ; Jaouen, Michele Real space maps of magnetic moments on the atomic scale: Theory and feasibilityArtikel Article 2010
10Schattschneider, P. ; Stöger-Pollach, M. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Hell, J. ; Verbeeck, J. Sub-nanometer free electrons with topological chargeArtikel Article 2012
11Horák, Michal ; Stöger-Pollach, Michael The Čerenkov limit of Si, GaAs and GaP in electron energy loss spectrometryArtikel Article 2015
12Stöger-Pollach, Michael ; Kachtík, Lukáš ; Miesenberger, Bernhard ; Retzl, Philipp Transition radiation in EELS and cathodoluminescenceArtikel Article 2017
13Kaiser, U. ; Biskupek, J. ; Meyer, J.C. ; Leschner, J. ; Lechner, L. ; Rose, H. ; Stöger-Pollach, M. ; Khlobystov, A.N. ; Hartel, P. ; Müller, H. ; Haider, M. ; Eyhusen, S. ; Benner, G. Transmission electron microscopy at 20 kV for imaging and spectroscopyArtikel Article2011
14Stöger-Pollach, Michael ; Schachinger, Thomas ; Biedermann, Kati ; Beyer, Volkhard Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beamsArtikel Article 2017