Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Filter:
Access Type:  Open Access

Results 1-6 of 6 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stoeger-Pollach-2023-Ultramicroscopy-vor.pdf.jpgStöger-Pollach, Michael ; Zenz, Keanu ; Ursin, Felix ; Schilberg, Johannes ; Stöger, Leo A correction for higher-order refraction in cathodoluminescence spectrometryArticle Artikel 2023
2Ederer-2022-Ultramicroscopy-vor.pdf.jpgEderer, Manuel ; Löffler, Stefan Image difference metrics for high-resolution electron microscopyArticle Artikel Oct-2022
3Lammer-2022-Ultramicroscopy-vor.pdf.jpgLammer, Judith ; Berger, Christian ; Löffler, Stefan ; Knez, Daniel ; Longo, Paolo ; Kothleitner, Gerald ; Hofer, Ferdinand ; Haberfehlner, Georg ; Bucher, Edith ; Sitte, Werner ; Grogger, Werner A method for a column-by-column EELS quantification of barium lanthanum ferrateArticle Artikel 26-Jan-2022
4Ederer-2024-Ultramicroscopy-vor.pdf.jpgEderer, Manuel ; Löffler, Stefan Optimizing experimental parameters for orbital mappingArticle Artikel Feb-2024
5Loeffler-2022-Ultramicroscopy-vor.pdf.jpgLöffler, Stefan Unitary two-state quantum operators realized by quadrupole fields in the electron microscopeArticle Artikel Apr-2022
6Stoeger-Pollach-2020-Ultramicroscopy-vor.pdf.jpgStöger-Pollach, Michael ; Löffler, Stefan ; Maurer, Niklas ; Bukvišová, Kristýna Using Čerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceArtikel Article Jul-2020