Stöger-Pollach, M., Zenz, K., Ursin, F., Schilberg, J., & Stöger, L. (2023). A correction for higher-order refraction in cathodoluminescence spectrometry. Ultramicroscopy, 251, 113770. https://doi.org/10.1016/j.ultramic.2023.113770
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie E311-01-4 - Forschungsgruppe Fertigungsmesstechnik und adaptronische Systeme
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Journal:
Ultramicroscopy
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ISSN:
0304-3991
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Date (published):
2023
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Number of Pages:
6
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Publisher:
ELSEVIER
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Peer reviewed:
Yes
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Keywords:
Cathodoluminescence; Transmission electron microscope; Refraction of light
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Abstract:
Cathodoluminescence (CL) is a developing analytical method in electron microscopy, because of its excellent energy resolution. Usually a Czerny–Turner type spectrometer is employed, having a blazed grating as analyzer. Unlike a prism analyzer, where the dispersion depends on the refractive index of the prism itself leading to a non-linear spectral distribution, the grating has the advantage that the spectral distribution depends linearly on the wavelength. As a draw-back, higher-order refraction alters the measured optical spectrum at larger wavelengths. In general, blazed gratings are used in order to minimize this effect in a certain spectral range. Nevertheless, the higher-order intensities can be still significant. In the present study we present a method for correcting the acquired optical spectra with respect to higher order diffraction intensities and apply it to CaO and GaN CL-spectra.
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Research facilities:
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie