Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Stöger-Pollach, M.

Results 1-20 of 22 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stöger-Pollach, Michael A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMArtikel Article2014
2Stöger-Pollach, Michael ; Pichler, Cornelia F. ; Dan, Topa ; Zickler, Gregor A. ; Bukvišová, Kristýna ; Eibl, Oliver ; Brandstätter, Franz Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscopeArtikel Article 2021
3Wallisch, Wolfgang ; Stöger-Pollach, Michael ; Navickas, Edvinas Consequences of the CMR effect on EELS in TEMArtikel Article 2017
4Stoeger-Pollach-2023-Ultramicroscopy-vor.pdf.jpgStöger-Pollach, Michael ; Zenz, Keanu ; Ursin, Felix ; Schilberg, Johannes ; Stöger, Leo A correction for higher-order refraction in cathodoluminescence spectrometryArticle Artikel 2023
5Scheucher, Michael ; Schachinger, Thomas ; Spielauer, Thomas ; Stöger-Pollach, Michael ; Haslinger, Philipp Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlationsArticle Artikel 18-Aug-2022
6Schachinger, T. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Stöger-Pollach, M. ; Schneider, S. ; Pohl, D. ; Rellinghaus, B. ; Schattschneider, P. EMCD with an electron vortex filter: Limitations and possibilitiesArtikel Article 2017
7Kaiser, Ute ; Stöger-Pollach, Michael Foreword to the special issue low-voltage electron microscopyArtikel ArticleOct-2014
8Stöger-Pollach, Michael ; Bukvišová, Kristýna ; Schwarz, Sabine ; Kvapil, Michal ; Šamořil, Tomáš ; Horák, Michal Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductorsArtikel Article 2019
9Stöger-Pollach, M. ; Schattschneider, P. The influence of relativistic energy losses on bandgap determination using valence EELSArtikel Article Nov-2007
10Schattschneider, P. ; Löffler, S. ; Stöger-Pollach, M. ; Verbeeck, J. Is magnetic chiral dichroism feasible with electron vortices?Artikel Article 2014
11Stöger-Pollach, M. Low voltage EELS-How low?Artikel Article2014
12Schattschneider, Peter ; Hébert, Cécile ; Rubino, Stefano ; Stöger-Pollach, Michael ; Rusz, Ján ; Novák, Pavel Magnetic circular dichroism in EELS: Towards 10 nm resolutionArtikel Article2008
13Hébert, C. ; Schattschneider, P. ; Rubino, S. ; Novak, P. ; Rusz, J. ; Stöger-Pollach, M. Magnetic circular dichroism in electron energy loss spectrometryArtikel Article2008
14Schachinger, T. ; Löffler, S. ; Stöger-Pollach, M. ; Schattschneider, P. Peculiar rotation of electron vortex beamsArtikel Article 2015
15Schattschneider, Peter ; Ennen, Inga ; Stöger-Pollach, Michael ; Verbeeck, Johan ; Mauchamp, Vincent ; Jaouen, Michele Real space maps of magnetic moments on the atomic scale: Theory and feasibilityArtikel Article 2010
16Schattschneider, P. ; Stöger-Pollach, M. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Hell, J. ; Verbeeck, J. Sub-nanometer free electrons with topological chargeArtikel Article 2012
17Horák, Michal ; Stöger-Pollach, Michael The Čerenkov limit of Si, GaAs and GaP in electron energy loss spectrometryArtikel Article 2015
18Stöger-Pollach, Michael ; Kachtík, Lukáš ; Miesenberger, Bernhard ; Retzl, Philipp Transition radiation in EELS and cathodoluminescenceArtikel Article 2017
19Kaiser, U. ; Biskupek, J. ; Meyer, J.C. ; Leschner, J. ; Lechner, L. ; Rose, H. ; Stöger-Pollach, M. ; Khlobystov, A.N. ; Hartel, P. ; Müller, H. ; Haider, M. ; Eyhusen, S. ; Benner, G. Transmission electron microscopy at 20 kV for imaging and spectroscopyArtikel Article2011
20Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article2008