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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Stöger-Pollach, Michael ; Pichler, Cornelia F. ; Dan, Topa ; Zickler, Gregor A. ; Bukvišová, Kristýna ; Eibl, Oliver ; Brandstätter, Franz | Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope | Artikel Article  | 2021 |
| 2 | | Wallisch, Wolfgang ; Stöger-Pollach, Michael ; Navickas, Edvinas | Consequences of the CMR effect on EELS in TEM | Artikel Article | 2017 |
| 3 | | Schachinger, T. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Stöger-Pollach, M. ; Schneider, S. ; Pohl, D. ; Rellinghaus, B. ; Schattschneider, P. | EMCD with an electron vortex filter: Limitations and possibilities | Artikel Article | 2017 |
| 4 | | Kaiser, Ute ; Stöger-Pollach, Michael | Foreword to the special issue low-voltage electron microscopy | Artikel Article | Oct-2014 |
| 5 | | Stöger-Pollach, Michael ; Bukvišová, Kristýna ; Schwarz, Sabine ; Kvapil, Michal ; Šamořil, Tomáš ; Horák, Michal | Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors | Artikel Article | 2019 |
| 6 | | Stöger-Pollach, M. ; Schattschneider, P. | The influence of relativistic energy losses on bandgap determination using valence EELS | Artikel Article | Nov-2007 |
| 7 | | Schattschneider, P. ; Löffler, S. ; Stöger-Pollach, M. ; Verbeeck, J. | Is magnetic chiral dichroism feasible with electron vortices? | Artikel Article | 2014 |
| 8 | | Stöger-Pollach, M. | Low voltage EELS-How low? | Artikel Article | 2014 |
| 9 | | Schattschneider, Peter ; Hébert, Cécile ; Rubino, Stefano ; Stöger-Pollach, Michael ; Rusz, Ján ; Novák, Pavel | Magnetic circular dichroism in EELS: Towards 10 nm resolution | Artikel Article | 2008 |
| 10 | | Hébert, C. ; Schattschneider, P. ; Rubino, S. ; Novak, P. ; Rusz, J. ; Stöger-Pollach, M. | Magnetic circular dichroism in electron energy loss spectrometry | Artikel Article | 2008 |
| 11 | | Schachinger, T. ; Löffler, S. ; Stöger-Pollach, M. ; Schattschneider, P. | Peculiar rotation of electron vortex beams | Artikel Article | 2015 |
| 12 | | Schattschneider, P. ; Stöger-Pollach, M. ; Löffler, S. ; Steiger-Thirsfeld, A. ; Hell, J. ; Verbeeck, J. | Sub-nanometer free electrons with topological charge | Artikel Article | 2012 |
| 13 | | Horák, Michal ; Stöger-Pollach, Michael | The Čerenkov limit of Si, GaAs and GaP in electron energy loss spectrometry | Artikel Article | 2015 |
| 14 | | Stöger-Pollach, Michael ; Kachtík, Lukáš ; Miesenberger, Bernhard ; Retzl, Philipp | Transition radiation in EELS and cathodoluminescence | Artikel Article | 2017 |
| 15 | | Kaiser, U. ; Biskupek, J. ; Meyer, J.C. ; Leschner, J. ; Lechner, L. ; Rose, H. ; Stöger-Pollach, M. ; Khlobystov, A.N. ; Hartel, P. ; Müller, H. ; Haider, M. ; Eyhusen, S. ; Benner, G. | Transmission electron microscopy at 20 kV for imaging and spectroscopy | Artikel Article | 2011 |
| 16 | | Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. | Treating retardation effects in valence EELS spectra for Kramers-Kronig analysis | Artikel Article | 2008 |
| 17 | | Stöger-Pollach, Michael ; Schachinger, Thomas ; Biedermann, Kati ; Beyer, Volkhard | Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beams | Artikel Article | 2017 |
