Electrodynamics, Microwave and Circuit Engineering

Organization Name (de) Name der Organisation (de)
E354 - Electrodynamics, Microwave and Circuit Engineering
 
Code Kennzahl
E354
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 

SubOrgUnits



Results 161-180 of 291 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
161Gaberl, Wolfgang ; Schneider-Hornstein, Kerstin ; Enne, Reinhard ; Steindl, Bernhard ; Zimmermann, Horst Avalanche photodiode with high responsivity in 0.35 μm CMOSArtikel Article 2014
162Hofbauer, Michael ; Schweiger, Kurt ; Zimmermann, Horst ; Giesen, Ulrich ; Langner, Frank ; Schmid, Ulrich ; Steininger, Andreas Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha IrradiationArtikel Article2013
163Veeravalli, Varadan Savulimedu ; Polzer, Thomas ; Schmid, Ulrich ; Steininger, Andreas ; Hofbauer, Michael ; Schweiger, Kurt ; Dietrich, Horst ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst ; Voss, Kay-Obbe ; Merk, Bruno ; Hajek, Michael An infrastructure for accurate characterization of single-event transients in digital circuitsArtikel Article2013
164Atef, Mohamed ; Zimmermann, Horst Low-power 10 Gb/s inductorless inverter based common-drain active feedback transimpedance amplifier in 40 nm CMOSArtikel Article2013
165Atef, Mohamed ; Polzer, Andreas ; Zimmermann, Horst High-speed photodiodes in 40 nm standard CMOS technologyArtikel Article2013
166Denzler, J K ; Koppensteiner, J ; Arthaber, H Grain angle detection on local scale using microwave transmissionArtikel Article2013
167Tadic, Niksa ; Zogovic, Milena ; Gaberl, Wolfgang ; Zimmermann, Horst On frequency response and stability of an optical front-end with variable-gain current amplifier using a bipolar junction transistor translinear loopArtikel Article2013
168Aichholzer, Andreas ; Arthaber, Holger ; Schuberth, Christian ; Mayer, Herwig Non-Destructive Evaluation of Grain Angle, Moisture Content and Density of Spruce with MicrowavesArtikel Article2013
169Atef, Mohamed ; Polzer, Andreas ; Zimmermann, Horst Avalanche Double Photodiode in 40-nm Standard CMOS TechnologyArtikel Article2013
170Enne, R. ; Nikolic, M. ; Zimmermann, H. Dynamic Integrated MPP Tracker in 0.35 μm CMOSArtikel Article2013
171Atef, Mohamed ; Zimmermann, Horst Optical Receiver Using Noise Cancelling With an Integrated Photodiode in 40 nm CMOS TechnologyArtikel Article2013
172Nikolic, Miodrag ; Enne, Reinhard ; Goll, Bernhard ; Zimmermann, Horst Nonlinear Current Control for Power electronic Converters: IC Design Aspects and ImplementationArtikel Article2013
173Brandl, Paul ; Schidl, Stefan ; Polzer, Andreas ; Gaberl, Wolfgang ; Zimmermann, Horst Optical Wireless Communication With Adaptive Focus and MEMS-Based Beam SteeringArtikel Article2013
174Schidl, Stefan ; Polzer, Andreas ; Dong, Jingfei ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst Investigation of transient photocurrent response of tripel pn junction structureArtikel Article2013
175Kostov, P. ; Gaberl, W. ; Zimmermann, H. High-speed bipolar phototransistors in a 180 nm CMOS processArtikel Article2013
176Brandl, Paul ; Zimmermann, Horst 3 Gbit/s optical receiver IC with high sensitivity and large integrated pin photodiodeArtikel Article2013
177Walter, Christian ; Syafrudin, Mohammad ; Schweinzer, Herbert A Self-Contained and Self-Checking LPS with High AccuracyArtikel Article 2013
178Schweiger, Kurt ; Hofbauer, Michael ; Dietrich, Horst ; Zimmermann, Horst ; Voss, K.O. ; Merk, B. Position dependent measurement of single event transient voltage pulse shapes under heavy ion irradiationArtikel Article 2-Feb-2012
179Schweiger, Kurt ; Zimmermann, Horst Passive mixer with OPA filter for DVB-H front-end in 65 nm digital CMOS technologyArtikel Article2012
180Schidl, S. ; Schweiger, K. ; Gaberl, W. ; Zimmermann, H. Analogously tunable delay line for on-chip measurements with sub-picosecond resolution in 90 nm CMOSArtikel Article2012