Rechnerische Unsicherheitsquantifizierung in Nanotechnologie


Project Acronym Projekt Kurzbezeichnung
UncertQuant
 
Project Title (de) Projekttitel (de)
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie
 
Project Title (en) Projekttitel (en)
Computational Uncertainty Quantifications in Nanotechnology
 
 
Principal Investigator Projektleiter_in
 
Funder/Funding Agency Fördergeber
FWF - Österr. Wissenschaftsfonds
Grant number Förderkennnummer
V 1000-N
 

Results 1-13 of 13 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schneider, Fabian ; Helin, Tapio ; Taghizadeh, Leila Neural likelihood approximation for Bayesian inverse problemsPresentation Vortrag22-Jul-2026
2Schneider, Fabian ; Helin, Tapio ; Taghizadeh, Leila A Convex Approximation Framework for Neural Likelihood-Based Bayesian Inverse ProblemsPreprint Preprint7-Jul-2026
3Schneider, Fabian Score-Based Diffusion Models for Bayesian Inverse Problems in Medical ImagingPresentation Vortrag24-Jun-2026
4Taghizadeh, Leila ; Schneider, Fabian A Markov chain Monte Carlo approach for Bayesian inverse problems with limited dataInproceedings Konferenzbeitrag1-Jun-2026
5Taghizadeh, Leila PDE-based Bayesian Inverse Problems in NanotechnologyPresentation Vortrag7-Nov-2025
6Taghizadeh, Leila PDE-based Bayesian Inversion in NanoelectronicsInproceedings Konferenzbeitrag4-Sep-2025
7Taghizadeh, Leila ; Jüngel, Ansgar Infinite Dimensional Bayesian Inversion for Semiconductor DevicesInproceedings KonferenzbeitragApr-2025
8Mousavi, Aida ; Taghizadeh, Leila Bayesian parameter identification for the Brusselator reaction-diffusion modelInproceedings Konferenzbeitrag28-Feb-2025
9Taghizadeh, Leila Uncertainty Quantification in Semiconductor ModelsPresentation Vortrag20-Feb-2025
10Taghizadeh, Leila ; Jüngel, Ansgar Bayesian Inversion for the Identification of the Doping Profile in Unipolar Semiconductor DevicesArticle Artikel 2025
11Taghizadeh, Leila Bayesian Inversion for Semiconductor Inverse ProblemsPresentation Vortrag13-Aug-2024
12Taghizadeh, Leila Nanotechnology PDE Models under UncertaintyPresentation Vortrag4-Jun-2024
13Taghizadeh, Leila A pCN-MCMC Method for a Bayesian Inverse Problem in Nanoscale DevicesInproceedings Konferenzbeitrag21-Feb-2024