Name Card

Full name Familienname, Vorname
Poik, Mathias
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 25 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Single-Harmonic Response Open-Loop Kelvin-Probe Force MicroscopyArticle Artikel 16-Feb-2024
2Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Berger, Bernhard M. ; Sattler, Sebastian W. ; Schitter, Georg A contactless method for measuring amplitude and phase of RF voltages up to 26.5GHzArticle Artikel 23-Jan-2024
3Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Model-Based RF Sensing for Contactless High-Resolution Voltage MeasurementsArticle Artikel 20-Sep-2023
4Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage SensingInproceedings Konferenzbeitrag13-Jul-2023
5Hackl, Thomas ; Mesquida, Patrick ; Poik, Mathias ; Schitter, Georg Ac kelvin probe force microscopy enables nanoscale surface charge mapping in waterInproceedings Konferenzbeitrag2023
6Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Quantitative Surface Potential Measurements by AC Electrostatic Force MicroscopyInproceedings Konferenzbeitrag 2023
7Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in LiquidsArticle Artikel 19-Dec-2022
8Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Electrostatic Actuation of AFM Cantilevers in Aqueous SolutionsInproceedings Konferenzbeitrag 25-Aug-2022
9Hackl, Thomas ; Poik, Mathias ; Schitter, Georg DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force MicroscopyInproceedings Konferenzbeitrag 30-Jun-2022
10Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement ModesInproceedings Konferenzbeitrag 2022
11Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous SolutionsInproceedings Konferenzbeitrag 2022
12Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation of Self-Sensing Cantilever for DC-bias free AFM Imaging in LiquidInproceedings Konferenzbeitrag 2022
13Rufin, Manuel ; Nalbach, Mathis ; Andriotis, Orestis G. ; Poik, Matthias ; Schitter, Georg ; Thurner, Philipp J. AGE-related changes in indentation stiffness and surface charge of individual collagen fibrils through MGO glycationPräsentation Presentation2021
14Rufin, Manuel ; Nalbach, Mathis ; Andriotis, Orestis G. ; Poik, Matthias ; Schitter, Georg ; Thurner, Philipp J. Effect of glycation on surface charge and indentation stiffness of individual collagen fibrilsPräsentation Presentation2021
15Hackl, Thomas ; Poik, Matthias ; Schitter, Georg Automated Probe-Sample Alignment for the Evaluation of Integrated CircuitsKonferenzbeitrag Inproceedings 2021
16Rufin, Manuel ; Nalbach, Mathis ; Andriotis, Orestis G. ; Poik, Matthias ; Schitter, Georg ; Thurner, Philipp J. Glycation increases indentation stiffness and decreases surface charge of individual collagen fibrilsPräsentation Presentation2021
17Rufin, Manuel ; Nalbach, Mathis ; Andriotis, Orestis G. ; Poik, Matthias ; Schitter, Georg ; Thurner, Philipp J. Effect of glycation on surface charge and indentation stiffness of individual collagen fibrilsPräsentation Presentation2021
18Ito, Shingo ; Poik, Mathias ; Schlarp, Johannes ; Schitter, Georg Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth TradeoffArtikel Article 2020
19Ito, Shingo ; Poik, Mathias ; Csencsics, Ernst ; Schlarp, Johannes ; Schitter, Georg High-speed scanning chromatic confocal sensor for 3-D imaging with modeling-free learning controlArtikel Article 2020
20Poik, Mathias ; Kohl, Dominik ; Mayr, Mario ; Kerschner, Christoph ; Schitter, Georg A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical OscillationsArtikel Article 2020

Contributing Publications Mitbeteiligte Publikationen

Results 1-3 of 3 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schober Martin - 2023 - Contactless positioning for microwave measurements.pdf.jpgSchober, Martin Contactless positioning for microwave measurementsThesis Hochschulschrift 2023
2Mayr Mario - 2022 - Development of compact long-range atomic force microscope...pdf.jpgMayr, Mario Development of compact, long-range atomic force microscope for in-line measurementsThesis Hochschulschrift 2022
3Hackl Thomas - 2020 - Automated probe-sample alignment for the evaluation of...pdf.jpgHackl, Thomas Automated probe-sample alignment for the evaluation of integrated circuitsThesis Hochschulschrift 2020