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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy | Article Artikel  | 16-Feb-2024 |
| 2 | | Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Berger, Bernhard M. ; Sattler, Sebastian W. ; Schitter, Georg | A contactless method for measuring amplitude and phase of RF voltages up to 26.5GHz | Article Artikel | 23-Jan-2024 |
| 3 | | Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg | Model-Based RF Sensing for Contactless High-Resolution Voltage Measurements | Article Artikel | 20-Sep-2023 |
| 4 | | Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg | Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing | Inproceedings Konferenzbeitrag | 13-Jul-2023 |
| 5 | | Hackl, Thomas ; Mesquida, Patrick ; Poik, Mathias ; Schitter, Georg | Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water | Inproceedings Konferenzbeitrag | 2023 |
| 6 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy | Inproceedings Konferenzbeitrag | 2023 |
| 7 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids | Article Artikel | 19-Dec-2022 |
| 8 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | Electrostatic Actuation of AFM Cantilevers in Aqueous Solutions | Inproceedings Konferenzbeitrag | 25-Aug-2022 |
| 9 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy | Inproceedings Konferenzbeitrag | 30-Jun-2022 |
| 10 | | Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg | Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes | Inproceedings Konferenzbeitrag | 2022 |
| 11 | | Hackl, Thomas ; Poik, Mathias ; Schitter, Georg | Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous Solutions | Inproceedings Konferenzbeitrag | 2022 |
| 12 | | Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg | Mechatronic Demodulation of Self-Sensing Cantilever for DC-bias free AFM Imaging in Liquid | Inproceedings Konferenzbeitrag | 2022 |
| 13 | | Hackl, Thomas ; Poik, Matthias ; Schitter, Georg | Automated Probe-Sample Alignment for the Evaluation of Integrated Circuits | Konferenzbeitrag Inproceedings | 2021 |
