Full name Familienname, Vorname
Stöger-Pollach, Michael
 
 


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Subject:  TEM
Subject:  EELS

Results 1-4 of 4 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Scales, Ze ; Reisinger, Michael ; Taylor, Aidan ; Nelhiebel, Michael ; Stöger-Pollach, Michael Physical Characterization of Dislocations in III-N Semiconductors including Quantification and ClassificationPresentation Vortrag24-Nov-2022
2Stöger-Pollach, Michael The choice of the right beam energy for analytical (scanning) transmission electron microscopyPresentation Vortrag6-Sep-2022
3Scales, Ze ; Reisinger, Michael ; Koller, Christian ; Taylor, Aidan ; Stöger-Pollach, Michael Physical Characterization of Crystal Defects in Gallium NitridePresentation Vortrag8-May-2022
4Löffler, Stefan ; Stöger-Pollach, Michael ; Steiger-Thirsfeld, Andreas ; Hetaba, Walid ; Schattschneider, Peter Exploiting the Acceleration Voltage Dependence of EMCDArtikel Article 2021



Filter:
Subject:  TEM
Subject:  EELS

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wallisch Wolfgang - 2019 - Consequences of the CMR effect in EELS by using TEM.pdf.jpgWallisch, Wolfgang Consequences of the CMR effect in EELS by using TEMThesis Hochschulschrift 2019