| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Ender, Johannes ; Lacerda de Orio, Roberto ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor | Reinforcement learning to reduce failures in SOT-MRAM switching | Artikel Article | 2022 |
| 2 | | Ceric, Hajdin ; Zahedmanesh, Houman ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Yurish, Sergey Y. | Models and Techniques for Reliability Studies of Nano-Scaled Interconnects | Buchbeitrag Book Contribution ![peer reviewed](/image/PeerReview_Icon.png) | 2021 |
| 3 | | Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor ; Martino, J. A. ; Nguyen, B.-Y. ; Gamiz, Francisco ; Ishii, H. ; Raskin, J.-P. ; Selberherr, Siegfried ; Simoen, E. | Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM | Buchbeitrag Book Contribution ![peer reviewed](/image/PeerReview_Icon.png) | 2020 |
| 4 | | Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor | Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM | Konferenzbeitrag Inproceedings ![peer reviewed](/image/PeerReview_Icon.png) | 2020 |
| 5 | ![Lacerda de Orio Roberto - 2010 - Electromigration modeling and simulation.pdf.jpg](/retrieve/62935/Lacerda%20de%20Orio%20Roberto%20-%202010%20-%20Electromigration%20modeling%20and%20simulation.pdf.jpg) | Lacerda de Orio, Roberto | Electromigration modeling and simulation | Thesis Hochschulschrift ![Volltext verfügbar](/image/Volltext_Icon.png) | 2010 |
| 6 | | Lacerda de Orio, Roberto ; Ceric, Hajdin | Analysis of electromigration in redundant vias | Konferenzbeitrag Inproceedings | 2008 |