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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Waltl, Michael ; Knobloch, Theresia ; Tselios, Konstantinos ; Filipovic, Lado ; Stampfer, Bernhard ; Hernandez, Yoanlys ; Waldhör, Dominic ; Illarionov, Yury ; Kaczer, Ben ; Grasser, Tibor | Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology? | Artikel Article  | 2022 |
| 2 |  | Waltl, Michael ; Waldhör, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of single-defects on the variability of CMOS inverter circuits | Article Artikel   | Nov-2021 |
| 3 | | Tselios, Konstantinos ; Waldhör, Dominic ; Stampfer, Bernhard ; Michl, Jakob ; Ioannidis, Eleftherios ; Enichlmair, H. ; Grasser, Tibor ; Waltl, Michael | On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors | Artikel Article | 2021 |
| 4 | | Waldhoer, Dominic ; Schleich, Christian ; Michl, Jakob ; Stampfer, Bernhard ; Tselios, Konstantinos ; Ioannidis, Eleftherios G. ; Enichlmair, Hubert ; Waltl, Michael ; Grasser, Tibor | Toward Automated Defect Extraction From Bias Temperature Instability Measurements | Artikel Article | 2021 |
| 5 | | Waltl, Michael ; Waldhoer, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of Single-Defects on the Variability of CMOS Inverter Circuits | Artikel Article | 2021 |
| 6 | | Tselios, K. ; Stampfer, B. ; Michl, J. ; Ioannidis, E. ; Enichlmair, H. ; Waltl, M. | Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors | Konferenzbeitrag Inproceedings | 2020 |