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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Lorenz, J. ; Asenov, A ; Baer, Eberhard ; Barraud, Sylvain ; Millar, C. ; Nedjalkov, Mihail | Process Variability for Devices at and Beyond the 7nm Node | Buchbeitrag Book Contribution  | 2018 |
| 2 | | Medina-Bailón, C. ; Sadi, T. ; Nedjalkov, Mihail ; Lee, J. ; Berrada, S. ; Carillo-Nunez, H. ; Georgiev, V. ; Selberherr, Siegfried ; Asenov, A | Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors | Konferenzbeitrag Inproceedings | 2018 |
| 3 | | Medina-Bailón, C. ; Sadi, T. ; Nedjalkov, Mihail ; Lee, J. ; Berrada, S. ; Carillo-Nunez, H. ; Georgiev, V. ; Selberherr, Siegfried ; Asenov, A | Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors | Konferenzbeitrag Inproceedings | 2018 |
| 4 | | Medina-Bailón, C. ; Sadi, T. ; Nedjalkov, Mihail ; Lee, J. ; Berrada, S. ; Carillo-Nunez, H. ; Georgiev, Vihar ; Selberherr, Siegfried ; Asenov, A | Impact of the Effective Mass on the Mobility in Si Nanowire Transistors | Konferenzbeitrag Inproceedings | 2018 |
| 5 | | Sadi, T. ; Towie, Ewan ; Nedjalkov, Mihail ; Asenov, A ; Selberherr, Siegfried | Monte Carlo Particles in Quantum Wires: Effects of the Confinement | Konferenzbeitrag Inproceedings | 2017 |
| 6 | | Wang, L. ; Sadi, T. ; Brown, A.R. ; Nedjalkov, Mihail ; Alexander, Craig ; Cheng, B. ; Millar, C. ; Asenov, A | Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs | Konferenzbeitrag Inproceedings | 2016 |
| 7 | | Nedjalkov, Mihail ; Ellinghaus, Paul ; Weinbub, Josef ; Selberherr, Siegfried ; Sadi, T. ; Asenov, A ; Wang, L. ; Amoroso, S. M. ; Towie, Ewan | Physical Models for Variation-Aware Device Simulation | Präsentation Presentation | 2016 |
| 8 | | Kaczer, Ben ; Amoroso, S. M. ; Hussin, Razaidi ; Asenov, A ; Franco, J. ; Weckx, P. ; Roussel, Ph. J. ; Rzepa, Gerhard ; Grasser, Tibor ; Horiguchi, N. | On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects | Konferenzbeitrag Inproceedings | 2016 |
| 9 | | Wang, L. ; Sadi, T. ; Nedjalkov, Mihail ; Brown, A.R. ; Alexander, Craig ; Cheng, B. ; Millar, C. ; Asenov, A | An Advanced Electro-Thermal Simulation Methodology For Nanoscale Device | Konferenzbeitrag Inproceedings | 2015 |
| 10 | | Wang, L. ; Brown, A.R. ; Nedjalkov, Mihail ; Alexander, Craig ; Cheng, B. ; Millar, C. ; Asenov, A | Impact of Self-Heating on the Statistical Variability in Bulk and SOI FinFETs | Artikel Article | 2015 |
| 11 | | Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Bukhori, Muhammad Faiz ; Roussel, Ph. J. ; Grasser, Tibor ; Asenov, A ; Groeseneken, G. | Impact of Individual Charged Gate-Oxide Defects on the Entire ID -VG Characteristic of Nanoscaled FETs | Artikel Article | 2012 |
| 12 | | Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Roussel, Ph. J. ; Mitard, J. ; Ragnarsson, L. A. ; Witters, L. ; Chiarella, T. ; Togo, M. ; Horiguchi, N. ; Groeseneken, G. ; Bukhori, Muhammad Faiz ; Grasser, Tibor ; Asenov, A | Impact of Single Charged Gate Oxide Defects on the Performance and Scaling of Nanoscaled FETs | Konferenzbeitrag Inproceedings | 2012 |
| 13 | | Kaczer, Ben ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Bukhori, Muhammad Faiz ; Asenov, A ; Schwarz, Benedikt ; Bina, Markus ; Grasser, Tibor ; Groeseneken, G. | The Relevance of Deeply-Scaled FET Threshold Voltage Shifts for Operation Lifetimes | Konferenzbeitrag Inproceedings | 2012 |
| 14 | | Ferrari, G ; Jacoboni, C. ; Nedjalkov, Mihail ; Asenov, A | Introducing Energy Broadening in Semiclassical Monte Carlo Simulations | Konferenzbeitrag Inproceedings | 2006 |
