Record link: 
http://hdl.handle.net/20.500.12708/151017
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Title: 
Impact of Self-Heating on the Statistical Variability in Bulk and SOI FinFETs
en
Citation: 
Wang, L., Brown, A. R., Nedjalkov, M., Alexander, C., Cheng, B., Millar, C., & Asenov, A. (2015). Impact of Self-Heating on the Statistical Variability in Bulk and SOI FinFETs. IEEE Transactions on Electron Devices, 62(7), 2106–2112. https://doi.org/10.1109/ted.2015.2436351
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Publisher DOI: 
10.1109/ted.2015.2436351
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Publication Type: 
Artikel - Original Research Article
de
 
Article - Original Research Article
en
Language: 
English
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Authors: 
Wang, L. 
Brown, A.R. 
Nedjalkov, Mihail 
Alexander, Craig 
Cheng, B. 
Millar, C. 
Asenov, A 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Journal: 
IEEE Transactions on Electron Devices 
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ISSN: 
0018-9383
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Date (published): 
2015
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Number of Pages: 
7
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Publisher: 
IEEE
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Peer reviewed: 
Yes
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Keywords: 
Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials
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Research Areas: 
Modelling and Simulation: 50%
Nanoelectronics: 50%
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
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