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Full name Familienname, Vorname
Zahedmanesh, Houman
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ceric, Hajdin ; Zahedmanesh, Houman ; Croes, Kristof ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Electromigration-Induced Void Evolution and Failure of Cu/SiCN Hybrid BondsArticle Artikel 14-Mar-2023
2Saleh, Ahmed S. ; Zahedmanesh, Houman ; Ceric, Hajdin ; De Wolf, Ingrid ; Croes, Kristof Impact of via geometry and line extension on via-electromigration in nano-interconnectsInproceedings Konferenzbeitrag2023
3Saleh, Ahmed ; Ceric, Hajdin ; Zahedmanesh, Houman Void-Dynamics in Nano-Wires and the Role of Microstructure Investigated via a Multi-Scale Physics-Based ModelArtikel Article 2021
4Ceric, Hajdin ; Zahedmanesh, Houman ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Models and Techniques for Reliability Studies of Nano-Scaled InterconnectsBuchbeitrag Book Contribution 2021
5Ceric, Hajdin ; Selberherr, Siegfried ; Zahedmanesh, Houman ; Orio, Roberto ; Croes, Kristof Assessment of Electromigration in Nano‐InterconnectsKonferenzbeitrag Inproceedings2019
6Ceric, Hajdin ; Zahedmanesh, Houman Advanced Modeling and Simulation of Cu Nano-Interconnects ReliabilityKonferenzbeitrag Inproceedings 2019
7Ceric, Hajdin ; Zahedmanesh, Houman ; Croes, Kristof Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental MethodsPräsentation Presentation2019