| Title: | Investigations of the growth mechanism of self-assembled alkylsiloxane films by atomic force microscopy, ellipsometry, and infrared spectroscopy | Language: | English | Authors: | Foisner, Johann | Qualification level: | Doctoral | Advisor: | Friedbacher, Gernot | Issue Date: | 2003 | Number of Pages: | 84 | Qualification level: | Doctoral | Keywords: | Siloxane; Alkylgruppe; Monoschicht; Wachstum; Selbstorganisation; Rasterkraftmikroskopie; Ellipsometrie; Infrarotspektroskopie | URI: | https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-11530 http://hdl.handle.net/20.500.12708/12152 |
Library ID: | AC04054985 | Organisation: | E164 - Institut für Chemische Technologien und Analytik | Publication Type: | Thesis Hochschulschrift |
| Appears in Collections: | Thesis |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| Foisner Johann - 2003 - Investigations of the growth mechanism of self-assembled...pdf | 6.25 MB | Adobe PDF |  View/Open |
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