Title: Investigations of the growth mechanism of self-assembled alkylsiloxane films by atomic force microscopy, ellipsometry, and infrared spectroscopy
Language: English
Authors: Foisner, Johann 
Qualification level: Doctoral
Advisor: Friedbacher, Gernot
Issue Date: 2003
Number of Pages: 84
Qualification level: Doctoral
URI: https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-11530
http://hdl.handle.net/20.500.12708/12152
Library ID: AC04054985
Organisation: E164 - Institut für Chemische Technologien und Analytik 
Publication Type: Thesis
Hochschulschrift
Appears in Collections:Thesis

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