| Title: | Investigations of the growth mechanism of self-assembled alkylsiloxane films by atomic force microscopy, ellipsometry, and infrared spectroscopy | Language: | English | Authors: | Foisner, Johann | Qualification level: | Doctoral | Advisor: | Friedbacher, Gernot | Issue Date: | 2003 | Number of Pages: | 84 | Qualification level: | Doctoral | URI: | https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-11530 http://hdl.handle.net/20.500.12708/12152 |
Library ID: | AC04054985 | Organisation: | E164 - Institut für Chemische Technologien und Analytik | Publication Type: | Thesis Hochschulschrift |
| Appears in Collections: | Thesis |
Files in this item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Investigations of the growth mechanism of self-assembled alkylsiloxane films by atomic force microscopy ellipsometry and infrared spectroscopy.pdf | 6.25 MB | Adobe PDF |  View/Open |
Page view(s)
18
checked on Feb 18, 2021
Download(s)
55
checked on Feb 18, 2021
Google ScholarTM
Check
Items in reposiTUm are protected by copyright, with all rights reserved, unless otherwise indicated.