Pfützner, H., Shilyashki, G., & Huber, E. (2020). Physical Assessment of the Magnetic Path Length of Energy Loss Testers. IEEE Transactions on Magnetics, 56(12), Article 6300407. https://doi.org/10.1109/tmag.2020.3025041
Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Epstein tester (ET); magnetic losses; magnetic path length (PL); silicon iron; single sheet tester (SST)
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Abstract:
Magnetic energy losses of SiFe sheets are determined by the standardized methods of single sheet tester (SST) or Epstein tester(ET). According to IEC standards, the total power consumption is measured in Watt-metric ways, and the portion that concerns the homogeneously magnetized region(s) is estimated on a nominal value lₘ of the so-called conventional effective magnetic path length
