Record link: 
http://hdl.handle.net/20.500.12708/144516
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Title: 
Convergent-beam EMCD: benefits, pitfalls and applications
en
Citation: 
Löffler, S., & Hetaba, W. (2018). Convergent-beam EMCD: benefits, pitfalls and applications. Microscopy, 67(1), 60–71. https://doi.org/10.1093/jmicro/dfx129
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Publisher DOI: 
10.1093/jmicro/dfx129
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Löffler, Stefan 
Hetaba, Walid 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
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Journal: 
Microscopy 
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ISSN: 
2050-5698
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Date (published): 
Mar-2018
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Number of Pages: 
12
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Publisher: 
OXFORD UNIV PRESS
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Peer reviewed: 
Yes
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Keywords: 
Instrumentation; Radiology, Nuclear Medicine and imaging; Structural Biology
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Research Areas: 
Materials Characterization: 50%
Quantum Modelling and Simulation: 50%
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Science Branch: 
Physik, Astronomie
Chemie
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