Record link: 
http://hdl.handle.net/20.500.12708/147763
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Title: 
Active-layer thickness estimation from X-band SAR backscatter intensity
en
Citation: 
Widhalm, B., Bartsch, A., Leibman, M., & Khomutov, A. (2017). Active-layer thickness estimation from X-band SAR backscatter intensity. The Cryosphere, 11(1), 483–496. https://doi.org/10.5194/tc-11-483-2017
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Publisher DOI: 
10.5194/tc-11-483-2017
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Widhalm, Barbara 
Bartsch, Annett 
Leibman, Marina 
Khomutov, Artem 
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Organisational Unit: 
E120-01-1 - Forschungsgruppe Mikrowellenfernerkundung 
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Journal: 
The Cryosphere 
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ISSN: 
1994-0416
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Date (published): 
10-Feb-2017
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Number of Pages: 
14
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Publisher: 
European Geosciences Union (EGU) ; Copernicus
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Peer reviewed: 
Yes
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Keywords: 
Water Science and Technology; Earth-Surface Processes
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Research Areas: 
Environmental Monitoring and Climate Adaptation: 100%
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Science Branch: 
Geodäsie, Vermessungswesen
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