<div class="csl-bib-body">
<div class="csl-entry">Seyedfaraji, S., Mesgari, B., & Rehman, S. (2022). AID: Accuracy Improvement of Analog Discharge-Based in-SRAM Multiplication Accelerator. In <i>2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)</i> (pp. 873–878). https://doi.org/10.23919/DATE54114.2022.9774748</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/152272
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dc.description.abstract
This paper presents a novel circuit (AID) to improve the accuracy of an energy-efficient in-memory multiplier using a standard 6T -SRAM. The state-of-the-art discharge-based in-SRAM multiplication accelerators suffer from a non-linear behavior in their bit-line (BL, BLB) due to the quadratic nature of the access transistor that leads to a poor signal-to-noise ratio (SNR). In order to achieve linearity in the BLB voltage, we propose a novel root function technique on the access transistor's gate that results in accuracy improvement of on average 10.77 dB SNR compared to state-of-the-art discharge-based topologies. Our analytical methods and a circuit simulation in a 65 nm CMOS technology verify that the proposed technique consumes 0.523 pJ per computation (multiplication, accumulation, and preset) from a power supply of 1V, which is 51.18% lower compared to other state-of-the-art techniques. We have performed an extensive Monte Carlo based simulation for a 4×4 multiplication operation, and our novel technique presents less than 0.086 standard deviations for the worst-case incorrect output scenario.
en
dc.language.iso
en
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dc.subject
Low Power
en
dc.subject
Neural Network
en
dc.subject
Process in Memory
en
dc.subject
SRAM
en
dc.title
AID: Accuracy Improvement of Analog Discharge-Based in-SRAM Multiplication Accelerator
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.relation.isbn
978-3-9819263-6-1
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dc.description.startpage
873
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dc.description.endpage
878
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dc.type.category
Full-Paper Contribution
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tuw.booktitle
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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tuw.researchTopic.id
I1
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tuw.researchTopic.id
I2
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tuw.researchTopic.name
Logic and Computation
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tuw.researchTopic.name
Computer Engineering and Software-Intensive Systems
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tuw.researchTopic.value
80
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tuw.researchTopic.value
20
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tuw.publication.orgunit
E384 - Institut für Computertechnik
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tuw.publisher.doi
10.23919/DATE54114.2022.9774748
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dc.description.numberOfPages
6
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tuw.author.orcid
0000-0003-0085-6282
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tuw.event.name
Design, Automation and Test in Europe Conference | The European Event for Electronic System Design & Test
en
tuw.event.startdate
14-03-2022
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tuw.event.enddate
23-03-2022
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tuw.event.online
Online
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tuw.event.type
Event for scientific audience
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tuw.event.place
ONLINE via VIRTUAL PLATFORM
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tuw.event.country
BE
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tuw.event.presenter
Seyedfaraji, Saeed
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tuw.presentation.online
Online
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wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
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wb.sciencebranch.oefos
2020
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wb.sciencebranch.value
100
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item.languageiso639-1
en
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item.grantfulltext
none
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item.cerifentitytype
Publications
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item.openairetype
conference paper
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item.openairecristype
http://purl.org/coar/resource_type/c_5794
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item.fulltext
no Fulltext
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crisitem.author.dept
E384-02 - Forschungsbereich Systems on Chip
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crisitem.author.dept
E354-02 - Forschungsbereich Integrated Circuits
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crisitem.author.dept
E384 - Institut für Computertechnik
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crisitem.author.orcid
0000-0003-0085-6282
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crisitem.author.parentorg
E384 - Institut für Computertechnik
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crisitem.author.parentorg
E354 - Electrodynamics, Microwave and Circuit Engineering
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crisitem.author.parentorg
E350 - Fakultät für Elektrotechnik und Informationstechnik