Record link: 
http://hdl.handle.net/20.500.12708/180143
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Title: 
Characterization of semiconductor power devices : laser interferometry and failure analysis
en
Citation: 
Fürböck, C. (2001). Characterization of semiconductor power devices : laser interferometry and failure analysis [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/180143
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CatalogPlus: 
AC03229700
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Publication Type: 
Thesis - Dissertation
en
Language: 
English
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Authors: 
Fürböck, Christoph 
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Date (published): 
2001
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Number of Pages: 
239
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Keywords: 
Halbleiterbauelement; Temperaturmessung; Ladungsträger; Laserinterferometrie; Fehleranalyse
de
Additional information: 
Zsfassung in dt. Sprache
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Appears in Collections:
Thesis

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