Record link: 
http://hdl.handle.net/20.500.12708/180722
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Title: 
Reliability and testing of semiconductor devices
en
Citation: 
Pogány, D. (2003). Reliability and testing of semiconductor devices [Professorial Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/180722
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CatalogPlus: 
AC03806039
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Publication Type: 
Thesis - Habilitationsschrift
en
Language: 
English
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Authors: 
Pogány, Dionyz 
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Date (published): 
2003
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Additional information: 
Enth. 12 Sonderabdr.
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Appears in Collections:
Thesis

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