Title: Gain and Pain of a Reliable Delay Model
Authors: Maier, Jürgen  
Issue Date: 11-Oct-2021
Citation: 
Maier, J. (2021). Gain and Pain of a Reliable Delay Model. In Proceedings 2021 24th Euromicro Conference on Digital System Design DSD 2021 (pp. 246–250). https://doi.org/10.34726/1681
Book Title: Proceedings 2021 24th Euromicro Conference on Digital System Design DSD 2021 
Abstract: 
In this paper we evaluate a promising delay estimation method, the Involution Delay Model. We apply it to three simple circuits (a combinatorial loop, an SR latch and an adder), interpret the delivered results and determine realistic overhead estimations. Comparisons to analog SPICE simulations reveal fine-grained behavioral coverage, whereat the commonly used digital inertial delay model shows severe shortcomings. Overall, the Involution Delay Model is able to identify a wide range of malicious behavior and is thus a viable upgrade to available delay models in modern digital timing simulation tools.
Keywords: glitch propagation; pulse degradation; faithful digital timing simulation; metastability analysis
URI: http://hdl.handle.net/20.500.12708/18634
https://doi.org/10.34726/1681
DOI: 10.34726/1681
Organisation: E191-02 - Forschungsbereich Embedded Computing Systems 
License: In Copyright 1.0
Publication Type: Inproceedings
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