Lammer, J., Löffler, S., Berger, C., Knez, D., Haberfehlner, G., Kothleitner, G., Hofer, F., Bucher, E., Sitte, W., & Grogger, W. (2022). How an ASEM Workshop led to a successful quantification for atomic-scale EELS maps. In 12th ASEM workshop on Advanced Electron Microscopy (pp. 8–8). Center for Surface and Nanoanalytics, JKU Linz. https://doi.org/10.34726/4642
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
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Published in:
12th ASEM workshop on Advanced Electron Microscopy
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Date (published):
21-Apr-2022
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Event name:
12th ASEM workshop on Advanced Electron Microscopy
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Event date:
21-Apr-2022 - 22-Apr-2022
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Event place:
Linz, Austria
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Number of Pages:
1
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Publisher:
Center for Surface and Nanoanalytics, JKU Linz, Linz
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Keywords:
EELS quantification; Barium lanthanum ferrate
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Abstract:
High-resolution STEM-EELS provides information about the composition of crystalline materials at the atomic scale, though a reliable quantitative chemical analysis is often hampered by zone axis conditions, where neighbouring atomic column intensities contribute to the signal at the probe position. In this work, we present a procedure to determine the concentration of two elements within equivalent atomic columns from EELS elemental maps - in our case barium and lanthanum within the A-sites of Ba1.1La1.9Fe2O7, a second order Ruddlesden-Popper phase. We took advantage of the large changes in the elemental distribution from column to column and introduced a technique, which substitutes inelastic scattering cross sections during the quantification step by using parameters obtained from the actual experiment. We considered channelling / de-channelling effects via inelastic multislice simulations and were thereby able to count occupancies in each atomic column. The EELS quantification results were then used as prior information during the Rietveld refinement in XRD measurements in order to differentiate between barium and lanthanum.
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Research facilities:
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie