Application of XPS in studies of model catalysts: from single crystals to supported nanoparticles

Abstract

This chapter describes X-ray photoelectron spectroscopy (XPS) studies of model catalysts, covering both ultrahigh vacuum (UHV) and near-ambient pressure (NAP) conditions, as well as operando characterization. A variety of UHV-grown model catalysts are presented, including single-crystal surfaces, surface alloys, thin oxide films, and supported nanoparticles. In addition to area-averaging measurements, a brief account of spatially resolved XPS by scanning photoelectron microscopy (SPEM) is given. The XPS model studies are typically paralleled by complementary experimental and computational methods, aiding in the full understanding of the XPS characterization.