Cakir, C. T., Buzanich, A. G., Reinholz, U., Streli, C., & Radtke, M. (2023, September 7). Enhancing Surface Analysis and Data Collection Efficiency using GE-XANES and Machine Learning: A Synchrotron-Based Study [Conference Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2023)), Clausthal, Germany. http://hdl.handle.net/20.500.12708/188576