<div class="csl-bib-body">
<div class="csl-entry">Tabean, S., Mousley, M., Hobler, G., De Castro, O., Wirtz, T., & Eswara, S. (2023). Analyses of Contrast in keV Scanning Transmission Helium Ion Microscopy. In <i>IUMRS-ICAM & ICMAT2023 Programme E-Guide</i>. IUMRS International Conference on Advanced Materials & 11th International Conference on Materials for Advanced Technologies, Singapore, Singapore.</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/189434
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dc.language.iso
en
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dc.subject
Scanning transmission ion microscopy
en
dc.subject
Binary collision simulation
en
dc.subject
Helium ion microscope
en
dc.title
Analyses of Contrast in keV Scanning Transmission Helium Ion Microscopy
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.contributor.affiliation
Luxembourg Institute of Science and Technology, Luxembourg
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dc.contributor.affiliation
Luxembourg Institute of Science and Technology, Luxembourg
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dc.contributor.affiliation
Luxembourg Institute of Science and Technology, Luxembourg
-
dc.contributor.affiliation
Luxembourg Institute of Science and Technology, Luxembourg
-
dc.contributor.affiliation
Luxembourg Institute of Science and Technology, Luxembourg