Record link: 
http://hdl.handle.net/20.500.12708/189434
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Title: 
Analyses of Contrast in keV Scanning Transmission Helium Ion Microscopy
en
Citation: 
Tabean, S., Mousley, M., Hobler, G., De Castro, O., Wirtz, T., & Eswara, S. (2023). Analyses of Contrast in keV Scanning Transmission Helium Ion Microscopy. In IUMRS-ICAM & ICMAT2023 Programme E-Guide. IUMRS International Conference on Advanced Materials & 11th International Conference on Materials for Advanced Technologies, Singapore, Singapore.
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Tabean, Saba 
Mousley, Michael 
Hobler, Gerhard 
De Castro, Olivier 
Wirtz, Tom 
Eswara, Santhana 
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Organisational Unit: 
E362-02 - Forschungsbereich Nanoelektronische Bauelemente 
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Published in: 
IUMRS-ICAM & ICMAT2023 Programme E-Guide 
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Date (published): 
27-Jun-2023
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Event name: 
IUMRS International Conference on Advanced Materials & 11th International Conference on Materials for Advanced Technologies 
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Event date: 
26-Jun-2023 - 30-Jun-2023
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Event place: 
Singapore, Singapore
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Number of Pages: 
1
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Keywords: 
Scanning transmission ion microscopy; Binary collision simulation; Helium ion microscope
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Research Areas: 
Materials Characterization: 70%
Modeling and Simulation: 30%
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Science Branch: 
2100 - Nanotechnologie: 80%
2020 - Elektrotechnik, Elektronik, Informationstechnik: 20%
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Appears in Collections:
Conference Paper

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