<div class="csl-bib-body">
<div class="csl-entry">Ingerle, D. (2023, August 8). <i>Grazing X-ray techniques for the nondestructive characterization of layered materials</i> [Presentation]. DXC DENVER X-RAY CONFERENCE, Lombard, United States of America (the).</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/190391
-
dc.description.abstract
The characterization of layered structures from the nanometer range to the 10 µm range is of increasing importance, especially if the analytical methods are non-destructive.
In the second part, GIXA, Dieter Ingerle will present the combination of Grazing incidence XRF (GIXRF) and X-ray reflectivity (XRR). GIXA allows the characterization of nanometer layers, the determination of the elemental composition, density and thickness. Setups, data evaluation software and showcases are presented.
en
dc.language.iso
en
-
dc.subject
X-ray diffraction methods
en
dc.title
Grazing X-ray techniques for the nondestructive characterization of layered materials
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.type.category
Presentation
-
tuw.publication.invited
invited
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.value
100
-
tuw.publication.orgunit
E141-05 - Forschungsbereich Radiation Physics
-
tuw.author.orcid
0000-0003-2686-7641
-
tuw.event.name
DXC DENVER X-RAY CONFERENCE
en
tuw.event.startdate
07-08-2023
-
tuw.event.enddate
11-08-2023
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Lombard
-
tuw.event.country
US
-
tuw.event.institution
72nd Annual Conference on Applications of X-ray Analysis