Ingerle, D. (2023, August 8). Grazing X-ray techniques for the nondestructive characterization of layered materials [Presentation]. DXC DENVER X-RAY CONFERENCE, Lombard, United States of America (the).
The characterization of layered structures from the nanometer range to the 10 µm range is of increasing importance, especially if the analytical methods are non-destructive.
In the second part, GIXA, Dieter Ingerle will present the combination of Grazing incidence XRF (GIXRF) and X-ray reflectivity (XRR). GIXA allows the characterization of nanometer layers, the determination of the elemental composition, density and thickness. Setups, data evaluation software and showcases are presented.
