Record link: 
http://hdl.handle.net/20.500.12708/191121
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Title: 
Interferometric Method for Direct Measurement of the Effective Mass in Two-Dimensional Systems
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Citation: 
Muravev, V. M., Shchepetilnikov, A. V., Dzhikirba, K. R., Kukushkin, I. V., Schott, R., Cheah, E., Wegscheider, W., & Shuvaev, A. (2023). Interferometric Method for Direct Measurement of the Effective Mass in Two-Dimensional Systems. Physical Review Applied, 19(2), Article 024039. https://doi.org/10.1103/PhysRevApplied.19.024039
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Publisher DOI: 
10.1103/PhysRevApplied.19.024039
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Publication Type: 
Article - Original Research Article
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Language: 
English
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Authors: 
Muravev, V. M. 
Shchepetilnikov, A. V. 
Dzhikirba, K. R. 
Kukushkin, I. V. 
Schott, R. 
Cheah, E. 
Wegscheider, W. 
Shuvaev, A. 
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Organisational Unit: 
E138-05 - Forschungsbereich Solid State Spectroscopy 
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Journal: 
Physical Review Applied 
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ISSN: 
2331-7019
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Date (published): 
Feb-2023
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Number of Pages: 
5
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Publisher: 
AMER PHYSICAL SOC
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Peer reviewed: 
Yes
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Keywords: 
electronic structure; metrology; Narrow band gap systems; quantum wells; Two-dimensional electron system; cyclotron resonance; Optical interferometry; Terahertz spectroscopy
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Abstract: 
We have developed a method of determining the effective mass of charge carriers in a two-dimensional electron system (2DES) based on the phase analysis of the radiation transmitted through the 2DES. This measurement technique is demonstrated in the experiments with a high-quality 2DES in InAs/AlSb and GaAs/(Al,Ga)As heterostructures. Furthermore, we find that the proposed approach gives compatible results with the cyclotron resonance spectroscopy method.
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Research Areas: 
Photonics: 50%
Surfaces and Interfaces: 25%
Non-metallic Materials: 25%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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