Muravev, V. M., Shchepetilnikov, A. V., Dzhikirba, K. R., Kukushkin, I. V., Schott, R., Cheah, E., Wegscheider, W., & Shuvaev, A. (2023). Interferometric Method for Direct Measurement of the Effective Mass in Two-Dimensional Systems. Physical Review Applied, 19(2), Article 024039. https://doi.org/10.1103/PhysRevApplied.19.024039
E138-05 - Forschungsbereich Solid State Spectroscopy
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Zeitschrift:
Physical Review Applied
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ISSN:
2331-7019
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Datum (veröffentlicht):
Feb-2023
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Umfang:
5
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Verlag:
AMER PHYSICAL SOC
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Peer Reviewed:
Ja
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Keywords:
electronic structure; metrology; Narrow band gap systems; quantum wells; Two-dimensional electron system; cyclotron resonance; Optical interferometry; Terahertz spectroscopy
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Abstract:
We have developed a method of determining the effective mass of charge carriers in a two-dimensional electron system (2DES) based on the phase analysis of the radiation transmitted through the 2DES. This measurement technique is demonstrated in the experiments with a high-quality 2DES in InAs/AlSb and GaAs/(Al,Ga)As heterostructures. Furthermore, we find that the proposed approach gives compatible results with the cyclotron resonance spectroscopy method.
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Forschungsschwerpunkte:
Photonics: 50% Surfaces and Interfaces: 25% Non-metallic Materials: 25%
