VUV spectrograph - characterization and optimization

Abstract

A spectrograph operating in the wavelength range of 120nm to 200nm is installed. Two different light detectors for the spectrograph are characterized, the first one using a Charged-Coupled Device as image sensor, and the second one using a combination of Micro-Channel Plate, phosphor screen and Complementary Metal-Oxide Semiconductor image sensor. Spectra of an excimer lamp are obtained and used for calibration, leading to a wavelength density on the focal plane of 0:0032nm per mm. Spectra of a deuterium arc lamp are also taken. Different control and data analysis tools are developed and tested, and different supply voltages of the Micro-Channel Plate and phosphor screen are measured in both signal and dark situations, and the signal-to-noise ratio compared.Furthermore, three attempts at creating a compact low-intensity, high-precision calibration source for vacuum-ultraviolet light are performed, resulting in the measurement of a Xenon excimer spectrum generated by an alpha source.Additionally, two new features for a transmission measurement setup operating in the Vacuum Ultraviolet wavelength range are developed, enhancing repeatability and measurement speed.