Advancing AFM-IR with Ultra-High Frequency Probes and Optomechanical Photonic Crystal Nanobeam Cavity Sensors

Abstract

Atomic Force Microscopy coupled with Infrared Spectroscopy (AFM-IR) has emerged as a powerful technique for nanoscale chemical imaging, offering high spatial resolution and sensitivity. However, to further enhance its capabilities, we propose integrating ultra-high frequency probes (>500MHz) and optomechanical photonic crystal nanobeam cavity sensors into the AFM-IR setup. This integration aims to achieve a temporal resolution of up to 2 ns and improve sensitivity of AFM-IR by exploiting the unique properties of both nanomechanical and nanophotonic systems. The utilization of ultra-high frequency probes enables swift scanning and detection of nanoscale features, complemented by optomechanical sensors boasting high-quality factor (>3×105) photonic crystal nanobeam cavities, which enhance sensitivity to infrared absorption-induced mechanical motion. This synergistic integration holds the promise of revolutionizing AFM-IR capabilities, facilitating precise chemical mapping with unparalleled spatiotemporal resolution and sensitivity. We anticipate widespread applications of this approach in fields such as materials science, biology, and nanotechnology, where accurate chemical characterization at the nanoscale is indispensable.