Hahn, R., Janknecht, R., Koutna, N., Todt, J., Meindlhumer, M., Davydok, A., Polcik, P., Kolozsvari, S., Jerg, C., Keckes, J., Mayrhofer, P. H., & Riedl-Tragenreif, H. (2024, October 9). Measuring Thin Film Elastic Constants using Combined X-ray Microdiffraction and Micromechanical Testing [Poster Presentation]. Nanomechanical Testing in Materials Research and Development IX, Messina, Italy. http://hdl.handle.net/20.500.12708/210986