Record link: 
http://hdl.handle.net/20.500.12708/214188
-
Title: 
Infinite Dimensional Bayesian Inversion for Semiconductor Devices
en
Citation: 
Taghizadeh, L., & Jüngel, A. (2025). Infinite Dimensional Bayesian Inversion for Semiconductor Devices. In 95th Annual Meeting of the Association of Applied Mathematics and Mechanics : Book of Abstracts (pp. 292–292). http://hdl.handle.net/20.500.12708/214188
-
Publication Type: 
Inproceedings - Abstract Book Contribution
en
Language: 
English
-
Authors: 
Taghizadeh, Leila 
Jüngel, Ansgar 
-
Organisational Unit: 
E101-03-2 - Forschungsgruppe Unsicherheitsquantifizierung 
E101-01-2 - Forschungsgruppe Analysis nichtlinearer PDEs 
-
Published in: 
95th Annual Meeting of the Association of Applied Mathematics and Mechanics : Book of Abstracts 
-
ISBN: 
978-83-7775-791-8
-
Date (published): 
Apr-2025
-
Event name: 
95th Annual Meeting of the Association of Applied Mathematics and Mechanics (2025) 
en
Event date: 
7-Apr-2025 - 11-Apr-2025
-
Event place: 
Poznan, Poland
-
Number of Pages: 
1
-
Keywords: 
Uncertainty quantification; Infinite-dimensional Bayesian inverse problem; Markov chain Monte Carlo methods; physics-informed prior; semiconductor devices
en
Project title: 
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie: V 1000-N (FWF - Österr. Wissenschaftsfonds) 
-
Research Areas: 
Mathematical and Algorithmic Foundations: 100%
-
Science Branch: 
1010 - Mathematik: 100%
-
Appears in Collections:
Conference Paper

Show full item record

Page view(s)

61
checked on Apr 23, 2025

Download(s)

3
checked on Apr 23, 2025

Google ScholarTM

Check