Record link: 
http://hdl.handle.net/20.500.12708/214188
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Title: 
Infinite Dimensional Bayesian Inversion for Semiconductor Devices
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Citation: 
Taghizadeh, L., & Jüngel, A. (2025). Infinite Dimensional Bayesian Inversion for Semiconductor Devices. In 95th Annual Meeting of the Association of Applied Mathematics and Mechanics : Book of Abstracts (pp. 292–292).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Taghizadeh, Leila 
Jüngel, Ansgar 
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Organisational Unit: 
E101-03-2 - Forschungsgruppe Unsicherheitsquantifizierung 
E101-01-2 - Forschungsgruppe Analysis nichtlinearer PDEs 
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Published in: 
95th Annual Meeting of the Association of Applied Mathematics and Mechanics : Book of Abstracts 
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ISBN: 
978-83-7775-791-8
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Date (published): 
Apr-2025
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Event name: 
95th Annual Meeting of the Association of Applied Mathematics and Mechanics (2025) 
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Event date: 
7-Apr-2025 - 11-Apr-2025
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Event place: 
Poznan, Poland
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Number of Pages: 
1
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Keywords: 
Uncertainty quantification; Infinite-dimensional Bayesian inverse problem; Markov chain Monte Carlo methods; physics-informed prior; semiconductor devices
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Research Areas: 
Mathematical and Algorithmic Foundations: 100%
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Science Branch: 
1010 - Mathematik: 100%
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Appears in Collections:
Conference Paper

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