Record link: 
http://hdl.handle.net/20.500.12708/218472
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Title: 
Neural Network for high-throughput materials characterization with X-ray photoelectron spectroscopy
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Citation: 
Simperl, F., & Werner, W. (2025). Neural Network for high-throughput materials characterization with X-ray photoelectron spectroscopy. In 34th International Conference on Photonic, Electronic and Atomic Collisions : ICPEAC 2025 : Book of Abstracts (pp. 611–611).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Simperl, Florian 
Werner, Wolfgang 
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Organisational Unit: 
E134-03 - Forschungsbereich Atomic and Plasma Physics 
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Published in: 
34th International Conference on Photonic, Electronic and Atomic Collisions : ICPEAC 2025 : Book of Abstracts 
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Date (published): 
4-Aug-2025
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Event name: 
34th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC-2025) 
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Event date: 
29-Jul-2025 - 5-Aug-2025
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Event place: 
Sapporo, Hokkaido, Japan
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Number of Pages: 
1
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Keywords: 
XPS; neural networks; spectrocopy
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Additional information: 
https://www.icpeac2025.jp/pdf/ICPEAC2025_Abstracts.pdf
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Research Areas: 
Surfaces and Interfaces: 100%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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Appears in Collections:
Conference Paper

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