<div class="csl-bib-body">
<div class="csl-entry">Taghizadeh, L. (2025). PDE-based Bayesian Inversion in Nanoelectronics. In <i>European Conference on Numerical Mathematics and Advanced Applications 2025 : Book of Abstracts</i> (pp. 162–162).</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/219506
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dc.description.sponsorship
FWF - Österr. Wissenschaftsfonds
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dc.language.iso
en
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dc.subject
Uncertainty quantification
en
dc.subject
Infinite-dimensional Bayesian inverse problem
en
dc.subject
Markov chain Monte Carlo methods
en
dc.subject
semiconductor devices
en
dc.title
PDE-based Bayesian Inversion in Nanoelectronics
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.description.startpage
162
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dc.description.endpage
162
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dc.relation.grantno
V 1000-N
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dc.type.category
Abstract Book Contribution
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tuw.booktitle
European Conference on Numerical Mathematics and Advanced Applications 2025 : Book of Abstracts
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tuw.project.title
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie